TECHGuru

  Scanning electron microscope are used for scanning various samples with the help of a focused beam of electrons where they are made to interact with the sample. This results in production of different signals containing information about the surface topography and composition thereby producing an image. Position of the beams is combined with the detected signal for producing a clear image and has the power to be observed in high and low vacuums, wet conditions as well as across a range of elevated temperatures. Most commonly used application of scanning electron microscopes involves detection of secondary electrons that are emitted when the atoms get excited where surface topography defines the number of secondary electrons that needs to be detected. Post scanning of sample and collection of secondary electrons through a detector, an image related to the topography of a specific surface is created. This is able to detect defaults even in nanometer scale increasing applications of...